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intro_wafer [2026/05/13 15:23] – [Manufacturing] gauthier.roussilhe.extintro_wafer [2026/05/13 17:01] (current) – [Database and tools] gauthier.roussilhe.ext
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 </figure> </figure>
  
-Furthermore, several datasets and models already exist, such as:+Furthermore, several datasets and models already exist from LCA databases such as:
   * [[https://codde.fr/en/our-brands/negaoctet|Negaoctet's dataset]]   * [[https://codde.fr/en/our-brands/negaoctet|Negaoctet's dataset]]
-  * [[https://netzero.imec-int.com|imec.netzero app]] 
   * [[https://db.resilio.tech/|Resilio's database]]   * [[https://db.resilio.tech/|Resilio's database]]
 +  * [[https://ecoquery.ecoinvent.org/3.8/cutoff/dataset/579/documentation|ecoinvent]]
 +
 +Several parametric models are also available from industry specialists:
 +  * [[https://netzero.imec-int.com|imec.netzero app]]
 +  * [[https://www.techinsights.com/solutions/semiconductor-manufacturing-carbon-model|TechInsight's Semiconductor Manufacturing Carbon Module]]
 +
  
-As an industry specialist, TechInsights also sell a [[https://www.techinsights.com/solutions/semiconductor-manufacturing-carbon-model|Semiconductor Manufacturing Carbon Module]] that provides fab-level and die-level assessments. However, the model is proprietary and cannot be audited to understand the methodology used. 
  
  
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   * [Back-end processes](back-end.md)   * [Back-end processes](back-end.md)
   * [3D NAND use case](3dnand-case.md)   * [3D NAND use case](3dnand-case.md)
 +  * [DRAM use case](dram-case.md)