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| intro_wafer [2026/05/13 16:58] – [Database and tools] gauthier.roussilhe.ext | intro_wafer [2026/05/13 17:01] (current) – [Database and tools] gauthier.roussilhe.ext |
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| </figure> | </figure> |
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| Furthermore, several datasets and models already exist from LCA databases or R&D effort, such as: | Furthermore, several datasets and models already exist from LCA databases such as: |
| * [[https://codde.fr/en/our-brands/negaoctet|Negaoctet's dataset]] | * [[https://codde.fr/en/our-brands/negaoctet|Negaoctet's dataset]] |
| * [[https://netzero.imec-int.com|imec.netzero app]] | |
| * [[https://db.resilio.tech/|Resilio's database]] | * [[https://db.resilio.tech/|Resilio's database]] |
| | * [[https://ecoquery.ecoinvent.org/3.8/cutoff/dataset/579/documentation|ecoinvent]] |
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| | Several parametric models are also available from industry specialists: |
| | * [[https://netzero.imec-int.com|imec.netzero app]] |
| | * [[https://www.techinsights.com/solutions/semiconductor-manufacturing-carbon-model|TechInsight's Semiconductor Manufacturing Carbon Module]] |
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| As an industry specialist, TechInsights also sell a [[https://www.techinsights.com/solutions/semiconductor-manufacturing-carbon-model|Semiconductor Manufacturing Carbon Module]] that provides fab-level and die-level assessments. However, the model is proprietary and cannot be audited to understand the methodology used. | |
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