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| dram-case.md [2026/05/13 15:53] – created gauthier.roussilhe.ext | dram-case.md [2026/05/13 15:54] (current) – [Process flow for 3D DRAM] gauthier.roussilhe.ext | ||
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| #3D DRAM manufacturing | #3D DRAM manufacturing | ||
| + | ## Process flow for 3D devices on DRAM | ||
| Xiao((Xiao, H. (2016). 3D IC Devices, Technologies, | Xiao((Xiao, H. (2016). 3D IC Devices, Technologies, | ||
| + | |||
| + | #### AA Module | ||
| + | * Wafer clean | ||
| + | * Pad oxidation | ||
| + | * SiN hard mask deposition | ||
| + | * Amorphous silicon hard mask deposition | ||
| + | * *AA mask 1* | ||
| + | * Etch top hard mask | ||
| + | * PR strip/clean | ||
| + | * *AA mask 2* | ||
| + | * Etch bottom hard mask | ||
| + | * PR strip and clean | ||
| + | * Etch pad oxide | ||
| + | * Etch silicon trench | ||
| + | * Wafer clean | ||
| + | * Oxidation | ||
| + | * STI oxide CVD to fill the trench | ||
| + | * STI oxide CMP, stop on nitride | ||
| + | * Wet strip nitride and pad oxide | ||
| + | * Wafer clean | ||
| + | |||
| + | #### Well formation | ||
| + | * Sacrificial oxide growth | ||
| + | * *Cell p-well mask* | ||
| + | * P-well implantation | ||
| + | * N + S/D implantation | ||
| + | * PR removal and clean | ||
| + | * *Peripheral n-well mask* | ||
| + | * N-well implantation | ||
| + | * PMOS VT adjust implantation | ||
| + | * PR removal and clean | ||
| + | * *Peripheral p-well mask* | ||
| + | * P-well implantation | ||
| + | * NMOS VT adjust implantation | ||
| + | * Photoresist removal and clean | ||
| + | * Sacrificial oxide removal and clean | ||
| + | * Rapid thermal anneal | ||
| + | |||
| + | #### BWL module | ||
| + | * Wafer clean | ||
| + | * Oxidation | ||
| + | * Hard-mask deposition | ||
| + | * BWL mask | ||
| + | * Etch hard mask | ||
| + | * BWL trench etch | ||
| + | * PR strip & clean | ||
| + | * Oxidation | ||
| + | * W and TiN etch back | ||
| + | * Wafer clean | ||
| + | * Oxide deposition | ||
| + | * Oxide CMP | ||
| + | * Strip hard-mask | ||
| + | * Oxide deposition | ||
| + | * TiN gate electrode deposition | ||
| + | * W deposition | ||
| + | |||
| + | #### BLC module | ||
| + | * Wafer clean | ||
| + | * Peripheral mask | ||
| + | * Etch oxide | ||
| + | * PR strip/ | ||
| + | * Gate oxidation and nitridation | ||
| + | * Polysilicon deposition | ||
| + | * Wafer clean | ||
| + | * PMOS poly-dope mask | ||
| + | * PMOS poly implantation | ||
| + | * PR strip/clean | ||
| + | * Array area mask | ||
| + | * Etch polysilicon | ||
| + | * PR strip/ | ||
| + | * BLC mask | ||
| + | * Etch oxide | ||
| + | * PR strip clean | ||
| + | * Polysilicon deposition | ||
| + | * TiN and W deposition | ||
| + | * SiN deposition | ||
| + | |||
| + | #### BL and peripheral transistor module | ||
| + | * Wafer clean | ||
| + | * BL mask | ||
| + | * BL and peripheral gate etch | ||
| + | * PR strip/ | ||
| + | * Re-oxidation | ||
| + | * Peripheral NMOS SDE mask | ||
| + | * Peripheral NMOS SDE implantation | ||
| + | * PR strip/clean | ||
| + | * Peripheral PMOS SDE mask | ||
| + | * Peripheral PMOS SDE implantation | ||
| + | * PR strip/clean | ||
| + | * Spacer dielectric film deposition | ||
| + | * Spacer film etch back | ||
| + | * Peripheral NMOS SD mask | ||
| + | * Peripheral NMOS SD implantation | ||
| + | * PR strip/clean | ||
| + | * Peripheral PMOS SD mask | ||
| + | * Peripheral PMOS SD implantation | ||
| + | * PR strip/clean | ||
| + | * RTA | ||
| + | |||
| + | |||
| + | #### SNC, peripheral contact, and M1 process steps | ||
| + | * ILD1 deposition | ||
| + | * LD1 CMP | ||
| + | * HM deposition | ||
| + | * SNC mask 1 | ||
| + | * Etch HM | ||
| + | * PR strip/clean | ||
| + | * SNC mask 2 | ||
| + | * Etch HM | ||
| + | * PR strip/clean | ||
| + | * Etch ILD1 | ||
| + | * Wafer clean | ||
| + | * Ti/TiN/W deposition | ||
| + | * W/TiN/Ti CMP | ||
| + | * Etch stop layer deposition | ||
| + | * ILD2 deposition | ||
| + | * M1 mask | ||
| + | * Etch ILD2 | ||
| + | * PR strip/clean | ||
| + | * Ti/TiN/W deposition | ||
| + | * W/TiN/Ti CMP | ||
| + | |||
| + | #### SN module | ||
| + | * Wafer clean | ||
| + | * Each stop layer (ESL) deposition | ||
| + | * ILD deposition | ||
| + | * SiN deposition | ||
| + | * SN mask 1 | ||
| + | * Etch nitride | ||
| + | * PR strip/ | ||
| + | * SN mask 2 | ||
| + | * Etch nitride | ||
| + | * PR strip/clean | ||
| + | * Etch oxide | ||
| + | * TiN deposition | ||
| + | * PR coating | ||
| + | * RP etch back | ||
| + | * TiN etch | ||
| + | * SiN slot mask | ||
| + | * Nitride etch | ||
| + | * PR strip/clean | ||
| + | * ILD removal | ||
| + | * Wafer clean | ||
| + | * High-k film deposition | ||
| + | * TiN and conducting filler deposition | ||
| + | |||
| + | |||
| + | #### V1 and M2 process steps | ||
| + | * Peripheral area mask | ||
| + | * Etch SiGe/ | ||
| + | * PR strip/clean | ||
| + | * ILD3 deposition | ||
| + | * ILD3 CMP | ||
| + | * V1 mask | ||
| + | * V1 etch | ||
| + | * PR strip and clean | ||
| + | * Ti/TiN deposition | ||
| + | * W deposition | ||
| + | * W/TiN/Ti CMP | ||
| + | * ESL deposition | ||
| + | * ILD4 deposition | ||
| + | * M2 mask | ||
| + | * M2 etch | ||
| + | * PR strip and clean | ||
| + | * Barrier and seed-layer deposition | ||
| + | * Bulk copper plating | ||
| + | * Cu anneal | ||
| + | * Cu CMP | ||
| + | |||
| + | #### V2 and M3 process steps | ||
| + | * ESL, ILD5, and dielectric cap deposition | ||
| + | * Metal HM deposition | ||
| + | * M3 mask | ||
| + | * HM etch | ||
| + | * PR strip and clean | ||
| + | * V2 mask | ||
| + | * Dielectric cap and ILD5 etch | ||
| + | * PR strip and clean | ||
| + | * ILD 5 etch | ||
| + | * ESL removal | ||
| + | * Clean | ||
| + | * Barrier and seed-layer deposition | ||
| + | * Bulk copper plating | ||
| + | * Cu anneal | ||
| + | * Cu CMP | ||
| + | |||
| + | #### V3-M4 and passivation process steps | ||
| + | * ESL and ILD6 deposition | ||
| + | * V3 mask | ||
| + | * ILD6 and ESL etch | ||
| + | * Pr strip and clean | ||
| + | * Ti/TiN/W deposition | ||
| + | * W/TiN/Ti CMP | ||
| + | * Wafer clean | ||
| + | * Ti/ | ||
| + | * M4 mask | ||
| + | * Etch TiN/ | ||
| + | * PR strip and clean | ||
| + | * Passivation oxide and nitride deposition | ||
| + | * Bond pad mask | ||
| + | * Etch nitride and oxide | ||
| + | * PR strip and clean | ||